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100μM 3D X Ray Inspection System For PCBA And Semiconductor Analysis

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SHENZHEN WEIMING PHOTOELECTRIC CO.,LTD.

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Name: 100μM 3D X Ray Inspection System For PCBA And Semiconductor Analysis
Brand: WELLMAN
Price: 1 USD

Brand Name : WELLMAN

Model Number : Ultra-One 3D/CT

Certification : CE/FDA

Place of Origin : CHINA

MOQ : 1

Payment Terms : T/T

X-ray Tube Type : Closed-tube X-ray source

Tube voltage range : 20-160 KV

Pixel matrix : 1536×1536

Equipment size : 1800 mm×1800 mm×2300 mm （Length × width × height）

Pixel size : 100μm

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Detection Applications

Equipment Characteristics

Technical Specifications

X-ray Source
Parameters
X-ray Tube Type		Closed-tube X-ray source
Tube voltage range		20-160 KV
Detector parameter
Detector type	Amorphous silicon fat panel detector
Pixel size	100 μm
Pixel matrix	1536×1536

Maximum possible sample size	Flat test bench 580×530mm Rotating test stand 300×300mm Rollover test stand250×300mm
Maximum imaging area	Flat test bench 460×410mm Rotating test stand 300×300mm Rollover test stand 250×100mm
JIMA card resolution	Standard 0.9μm,max 0.5μm
Equipment weight	4T
Equipment size	1800 mm×1800 mm×2300 mm(Length ×width×height)
Imaging software system	Integrated scanning imaging software;3D image reconstruction software;3D image measurement and analysis software;Image database management software.

Product Tags:

Semiconductor Analysis 3D X Ray Inspection

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